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BeamPeek™ system

Updated:2022-12-20

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Product Details

Functional features of the BeamPeek™ system:

User 's Manual

The BeamPeek™ integrates a laser beam profiler camera, power meter, beam dump, beam splitters, and optics to provide an all inclusive solution for additive manufacturing laser analysis in an industrial environment.

  1. Focal spot size

  2. Focal spot position calibrated to build plane

  3. Laser power

  4. Laser power density

  5. Changes in spot size & power over time

The BeamPeek allows up to 2 minutes of continuous measurement at 1kW with passive cooling, without any need for a fan or water/air chilling through a beam dump interchangeable cartridge. Its industrial design makes it easy to integrate into production lines and perform analysis of laser properties without interference with the production process.

Drawings of the BeamPeek™ system:

BeamPeek™ System Specifications:

Beam Profiling
Wavelengths 532nm, 1030-1080nm
Min-Max Focus Spot Size 34.5µm - 2mm
Power Range 10 - 1000 Watts
Focal Length 150mm-800mm
Focal spot position calibrated ±100µm
Beam Profiling ISO 11146 Measurements
Power Meter NIST traceable calibration ±3%
Compliance CE, UKCA, China RoHS

BeamPeek™ System FAQ

Is a periodical calibration required for the BP?

Yes, since the BeamPeek includes Ophir regular Power Meter.

Where is the Camera sensor/Focal plane positioned?

Unlike the BeamCheck that has the focal plane set so that the camera sensor is in focus when laser focus is positioned at bed surface, the BeamPeek camera sensor is approximate 75mm (the exact value is calibrated individually for each device) over the base/machine bed. To get the beam focus on camera sensor the machine bed must move down the by the calibrated value. The reason for this setup is improved power handling: higher maximum power and longer exposure time to high power.

What is the minimum waiting time to get power measurements results?

Minimum response time for power measurements is 3 seconds, as for power meters with thermal head.

IF power is higher value or longer exposure time than maximum allowed will the BeemPeek suffer heavy damage? How would I know if the device is damaged?

The BeamPeek is designed with some spare regarding overload, power or exposure time; if the recommended values were overpassed there are simple visual inspection besides the functional test that customer can perform: removal of Beam Dump tray, checking cleanliness of the protective window (can be removed and cleaned of outgassing due to very high power density or too long exposure), remove and inspect the diffusing interchangeable lens and looking thru the system aperture with lens removed to verify optics integrity in case of too high power.

If NIR laser wavelength 1070nm is used, which PM wavelength should be selected for measurements 1064nm or 1080nm?

Select the wavelength which is closest to laser wavelength, in this case 1064 is closer than 1080.

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