WinCamD-LCM-NE CMOS Beam Profiler

WinCamD-LCM-NE CMOS Beam Profiler Description：

Product Manual Datasheet Drawing

The WinCamD-LCM-NE takes CMOS beam profiler embodies DataRay's philosophy: providing our customers with affordable, high-quality products. Since its introduction, it has gone on to become far and away our most popular product, for good reason. Its 1" format CMOS sensor utilizes a global shutter, making it suitable for both CW and pulsed beams.

This NIR-enhanced version features improved spectral response between 400 and 1000 nm but, due to the presence of microlenses on the sensor, is unsuitable for use with UV wavelengths, and is not offered with TEL phosphor coating.

Key Features

355 to 1150 nm, standard CMOS detector

1310 nm option available

4.2 MPixel, 2048 x 2048 pixels, 11.3 x 11.3 mm active area

5.5 µm pixels

60 fps @ 512 x 512, 30 fps @ 1024 x 1024, 12 fps @ 2048 x 2048

Port-powered USB 3.0

HyperCal™ – Dynamic Noise and Baseline Correction software

MagND™ stackable magnetic ND filters or C-mount filters

2,500:1 Signal to RMS Noise

Global shutter with TTL trigger

Electronic auto-shutter, 85 µs to 2 sec (44 dB)

12-bit ADC

Isolated pulse triggering

Parallel capture on multiple cameras

Field-replaceable image sensors

Relative power level display

Window-free sensors standard for no fringing

ISO 11146 M² option – beam propagation analysis, divergence, focus

Available in specialized beam profiler systems

Industrial Laser Monitoring System (ILMS)

Large Beam Profiling System (LBPS)

Line Laser Profiling System (LLPS)

Example Applications

CW and pulsed laser profiling

Field servicing of lasers and laser-based systems

Optical assembly & instrument alignment

Beam wander & logging

M² measurement with available M2DU stage

Specification

Chart