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PS-200 UV to Visible Range Lab Spectroradiometer

Updated:2022-12-21

Brand: APOGEE
Model: PS-200
Product description: The PS-200 measures a wavelength range of 300 to 850 nm. The spectroradiometer comes in a complete package ready to connect to your computer and begin making measurements. Typical applications include
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Overview of PS-200 UV to Visible Range Lab Spectroradiometer

User's Manual

The PS-200 measures a wavelength range of 300 to 850 nm. The spectroradiometer comes in a complete package ready to connect to your computer and begin making measurements. Typical applications include measurement of spectral output (energy flux density, photon flux density, or illuminance) of different radiation sources (often for plant or human lighting), and reflectance and transmittance measurements of natural and synthetic surfaces and materials (often plant leaves and canopies.

THE PS-200 PACKAGE INCLUDES:

Spectroradiometer unit
Fiber optic cable (2 m)
Apogee cosine corrected radiometric head with black cap
Apogee bubble level plate
Apogee calibration (certificate upon request)
Apogee 2GB USB drive with data collection software and calibration files
Black USB 2.0 cable
Apogee carrying case
Reflectance wand
1 year warranty

Drawing of PS-200 spectrometer:

Specifications of PS-200 spectrometer:

Wavelength Sensitivity	190 to 850 nm
Irradiance Calibration Range	300 to 850 nm
Wavelength Resolution	0.85 nm
Detector Type	CCD, 2048 pixel
Grating Type	Holographic and aberration-corrected, 590 g/nm
Digitizer	16-bit
Signal to Noise Ratio	1000:1
Stray Light	0.02 % at 435 nm, 0.2 % at 200 nm
Measurement Repeatability	Less than 1 %
Calibration Uncertainty	± 10 %
Detector Integration (Exposure) Range	1 ms to 65 s
Directional (Cosine) Response	± 5 % at 80 ˚ zenith angle
Software	Windows compatible, included
Computer Interface	USB 2.0
Power Requirement	100 mA at 5 V DC, supplied via USB cable
Operating Temperature	0 to 60 ℃
Optical Cable	2 m armored fiber-optic
Base Unit Size	69 mm x 100 mm x 150 mm
Mass	900 g
Warranty	1 year against defects in materials and workmanship