Beam'R2 Description：

Product Manual Datasheet Drawing

DataRay’s Beam'R2 is well suited for many laser beam profiling applications. With both standard 2.5 µm slits and larger knife-edge slits, the Beam'R2 is capable of measuring beams with diameters as small as 2 µm. With options for both silicon and InGaAs or extended InGaAs, the Beam'R2 can profile beams from 190 nm to 2500 nm. Scanning slit instruments offer much higher resolution than camera based systems.

Key Features

Multiple detector options covering 190 to 2500 nm

190 to 1150 nm, Silicon detector

650 to 1800 nm, InGaAs detector

1800 to 2300/2500 nm, InGaAs (extended) detector

ISO compliant beam diameter measurements

Port-powered USB 2.0

Auto-gain function

Optional stage accessory for ISO 11146- compliant M² measurements

True2D™ slits

Resolution to 0.1 µm

5 Hz update rate (adjustable 2 to 10 Hz)

Profile CW/Quasi-CW beams

Beam diameters 5 µm to 4 mm, to 2 µm in Knife Edge mode

Example Applications

Very small laser beam profiling

Optical assembly and instrument alignment

OEM integration

Lens focal length testing

Real-time diagnosis of focusing and alignment errors

Real-time setting of multiple assemblies to the same focus

M² measurement with available M2DU stage

True2D™ Slits

0.4 µm thick metallic multilayer films on a sapphire substrate

Mutliple advantages over air slits

Avoid tunnel effect

Air slits are typically deeper than they are wide, and can buckle under high irradiance

Specification