BeamMap2 Description：

Product Manual Datasheet Drawing

DataRay’s BeamMap2 represents a radically different approach to real-time beam profiling. It extends the Beam'R2’s measurement capabilities by allowing for measurements at multiple locations along the beam’s travel. This real-time scanning slit system uses XY slit pairs in multiple Z planes on a rotating puck to simultaneously measure four beam profiles at four different Z locations. The BeamMap2’s unique design is most advantageous for real-time measurement of focus position, M², beam divergence, and pointing.

Key Features

Multiple detector options covering 190 to 2500 nm

190 to 1150 nm, Silicon detector

650 to 1800 nm, InGaAs detector

1800 to 2300/2500 nm, InGaAs (extended) detector

ISO compliant beam diameter measurements

Port-powered USB 2.0

Auto-gain function

Optional stage accessory for ISO 11146- compliant M² measurements

True2D™ slits

Resolution to 0.1 µm

5 Hz update rate (adjustable 2 to 10 Hz)

Profile CW/Quasi-CW beams

Beam diameters 5 µm to 4 mm

Multiple z-plane scanning

XYZ profiles, plus θ-Φ

Focus position and diameter

Real-time M², pointing, and divergence measurements

Identify focus with ±1 µm repeatability (beam dependent)

Example Applications

Very small laser beam profiling

Optical assembly and instrument alignment

OEM integration

Lens focal length testing

Real-time diagnosis of focusing and alignment errors

Real-time setting of multiple assemblies to the same focus

M² measurement with available M2DU stage

True2D™ Slits

0.4 µm thick metallic multilayer films on a sapphire substrate

Mutliple advantages over air slits

Avoid tunnel effect

Air slits are typically deeper than they are wide, and can buckle under high irradiance

Specification